Preparation and characterization of Zn1-xFexO thin films

MARI, B.; A. ELMANOUNI; L. C. DAMONTE; M.MOLLAR

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH

Wiley Interscience

Año: 2010 vol. A207 p. 1623 - 1626

0031-8965

Zn1-xFexO ternary thin films were electrodeposited from electrolytes containing Fe(II) and Fe(III) perchlorate precursors dissolved in dimethyl sulfoxide. The Fe molar fraction in the starting electrolyte ranged between 0 and 69 %. Films were deposited onto ITO/glass conductive substrates at 80ºC in presence of molecular O2 at deposition potentials ranging -0.7 to -0.9 volts. Any effect of the potential in this range was observed. Electrodeposited films were analysed by energy dispersion spectroscopy (EDS), XRD, optical transmittance and reflectivity spectroscopies. EDS results confirm the incorporation of iron in Zn1-xFexO films and the Fe final content x increases proportionally to the initial Fe/Zn ratio present in starting solution. XRD patterns proved that all Zn1-xFexO films have wurtzite crystal structure. The optical transmittance spectra show a high transmittance around 85% in visible region and the absorption edge becomes more deformed as the Fe concentration increase. Independent of their Fe content, the electrodeposited Zn1-xFexO films do not show any evidence of magnetic order.