IFIR 05409
INSTITUTO DE FISICA DE ROSARIO
Unidad Ejecutora - UE
artículos
Título:
Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
Autor/es:
LUCAS P.TENDELA; A. FEDERICO; G. H. KAUFMANN
Revista:
OPTICS AND LASERS IN ENGINEERING
Editorial:
ELSEVIER SCI LTD
Referencias:
Lugar: Amsterdam; Año: 2011 vol. 49 p. 281 - 284
ISSN:
0143-8166
Resumen:
This paper presents an interferometric measurement of the out-of-plane deflections produced by apiezoelectric transducer,manufactured by thick-film deposition of a ceramic paste over an aluminasubstrate,when is subjected to a DC electric voltage.It is shown that a digital speckle patterninterferometer with an incorporated phase-shifting facility allows the measurement of nanometerdisplacements generated by the piezoelectric device.These measurements are used to evaluate theeffective piezoelectric charge constant along the polarization direction (d33) eff that characterizes thethick-filmtransducer.
