New Advances in Energy Dispersive Resonant Inelastic X Ray Scattering. Invited Conference

H. J. SÁNCHEZ; J. J. LEANI; J. ROBLEDO; ROBERTO PÉREZ

Córdoba

Conferencia; International Symposium on Radiation Physics; 2018

In X-ray fluorescence analysis, spectra present singular characteristics produced by the different scattering processes. When atoms are irradiated with incident energy lower but close to an absorption edge, scattering peaks appear due to an inelastic process known as Resonant Inelastic X-ray Scattering (RIXS) or X-ray Resonant Raman Scattering (RRS) [1,2]. These RIXS/RRS peak presents a series of particular features; between them, a characteristic long-tail spreading to the region of lower energy. It has been recently observed that, hidden on this tail, there is valuable information about the local environment of the atom under study.During the last five years, several works have been shown the first applications of RIXS for the discrimination, determination and characterization of chemical environments in a variety of samples and irradiation geometries and even combined with other spectroscopic techniques [3-8]. One of the most important features of experimental setup reported in these works is the use of an energy dispersive low-resolution spectrometer.In this work, new applications of ED-RIXS are presented. Different non-conventional configurations, such as grazing incident/emission setups, micro-analysis, etc. are showed. Finally, the first test measurements using a conventional x-ray tube for characterizing oxidation states using ED-RIXS are described.