CHARACTERIZATION OF NANOMATERIALS BY SEM

M. CLAUDIA MARCHI

Buenos Aires, Capital

Workshop; First Latin American Workshop on Electron Microscopy: Material and Life Sciences, Microelectronics and E-Beam Lithography; 2008

Centro de Microscopías Avanzadas y Carl Zeiss

<!-- /* Style Definitions */ p.MsoNormal, li.MsoNormal, div.MsoNormal {mso-style-parent:""; margin:0cm; margin-bottom:.0001pt; mso-pagination:widow-orphan; font-size:12.0pt; mso-bidi-font-size:10.0pt; font-family:"Times New Roman"; mso-fareast-font-family:"Times New Roman"; mso-ansi-language:EN-US; mso-fareast-language:EN-US;} @page Section1 {size:612.0pt 792.0pt; margin:70.85pt 3.0cm 70.85pt 3.0cm; mso-header-margin:36.0pt; mso-footer-margin:36.0pt; mso-paper-source:0;} div.Section1 {page:Section1;} --> The scanning electron microscopy (SEM) is a technique widely used for the topological and morphological characterization in the science materials. The combination of higher magnification, larger depth of focus, greater resolution, and ease of sample observation makes the SEM one of the most heavily used instruments in research today. In this opportunity we will present results from several applications, field emission devices, fotonic cristals, catalysis, etc. We will emphasize the versatility of equipment, analyses available and perspective to future.