Synchrotron Radiation GI-XRF, GI-XANES and Energy Dispersive X-Ray Reflectivity Experiments Applied to Material and Life Sciences

C. A. PÉREZ; V. SUAREZ; J. J. LEANI; H. J. SÁNCHEZ; G.A. BONGIOVANNI

Osaka

Conferencia; TXRF-2013; 2013

Osaka City University

GI_XRF and GI_XANS are useful analytical techniques to perform nondesrtuctives studied of in-depth distributions of compositions and chemical structures from a few or several handreds nanometers range below the surface. While GI-XRF gives information about composition, density and thikness, GI-XANRS can be used to characterize the electronic structure of compounds. Recent works have shown that it can be possible to combine RRS with TR for porboin the chemical environment in the surface. In this work we will give on overview of the above mentioned techniques. We will also show some of the main recently results obtained from several experiments, carried our at the D09B XRF beramline of the LNLS, on specific systems which are nowadays topics of extensive discussions in material science and life science.