X-Ray Resonant Inelastic Scattering on Pure Samples and Oxides

M.C. VALENTINUZZI; H. J. SÁNCHEZ; J. ABRAHAM; C. A. PÉREZ

Campinas, Brasil

Congreso; RAU 18; 2008

Laboratorio Nacional de Luz sincrotrón

By means of X ray spectroscopy it is possible to characterize materials since whenX rays interact with atoms di®erent processes take place such as the photoelectricabsorption, the Rayleigh scattering and the Compton scattering, leading to spectrawith characteristic lines that allow to identify the components of the target and itis also possible to perform a quanti¯cation. But there are other processes that canalter the spectra obtained with X ray °uorescence, producing peaks that interferewith the °uorescent one causing a problem that has not been studied in detail sofar. These processes are inelastic scattering processes, such as the resonant Ra-man e®ect with an enhancement of the resonant behavior as the incident energyapproaches the absorption edge. In this work we present a comparison of the in-elastic resonant scattering (Raman e®ect) on pure samples and oxides in order tostudy if the oxidation state of the sample can interfere with the scattering process.The measurements were carried out in XRF station of the D09B-XRF beamlineat Brazilian synchrotron facility (LNLS, Campinas). Seven samples were analyzed:Mn, Mn2O3, Fe, Fe2O3, Cu, CuO, Cu2O using monochromatic synchrotron radia-tion to determine experimentally the cross sections of the resonant Raman e®ectas a function of the incident energy; energy scannings were carried out in di®erentranges of energies near the absorption edge of the target element. According to ourresults, the cross sections for pure samples are similar to those for oxides, showingthat the Raman scattering takes place in the same way in both kinds of samples.