A Study of the Properties of Beam Guides for TXRF using Synchrotron Radiation

H. J. SÁNCHEZ; M.C. VALENTINUZZI; C. A. PÉREZ

Campinas, Brasil

Congreso; RAU 14; 2004

Laboratorio Nacional de Luz Sincrotrón

This work reports a characterization of beam guides used for total reflection XRF analysis[1, 2] when synchrotron radi-ation is employed. Beam guides are new devices used in TXRF to improved the experimental conditions of this kind oftechnique.Several beam guides were built producing a set of devices of different dimensions and materials. They were mountedon the TXRF chamber of the XRF beamline at the LNLS. Standard samples of powder compounds were used as intensitymonitors. By selecting different monochromatic energies the transmitted flux of photons and the excitation intensity onthe sample were recorded as a function of the angle of incidence.The angular scanning showed complex structures of transmitted photons according to the orders of reflection insidethe beam guide. At present, theoretical calculations are been carried out in order to compare the experimental results withthe numerical predictions.