XAFS, SAXS and HREM characterization of Pd nanoparticles capped with n-alkyl thiol molecules

J. M. RAMALLO-LÓPEZ; GIOVANETTI, L.; REQUEJO, F. G.; VICENTÍN, F.; ALMAZO, M. M.; CRAIEVICH, A. F.; JOSE-YACAMAN, M.

La Plata

Congreso; 35th Anniversary of Hyperfine interactions at La Plata International Workshop; 2005

In the present work, we discuss the analysis of small Pd nanoparticles (NP) in the range of 1 to 1.5 nm using X-ray absorption techniques (XAFS), Small Angle X-ray Scattering (SAXS) and high resolution electron microscopy (HREM). Particles were grown using colloidal methods. Size and size-distribution of NP are well established by using SAXS and HREM studies. Sulfur-palladium interaction effects on structure and electronics of the resulting nanoestructured entities are described in terms of XANES and EXAFS characterization. We found a complete sulfurized palladium phase in all capped NP but slight differences according to the different length of thiols employed in the synthesis process.