EBSD: a major device for mechanical characterization of polycrystalline materials

GRACIELA BERTOLINO; DANIEL CALDEMAISON; JEROME CREPIN; MARIE DEXET; EVA HERIPRE

Escocia, Reino Unido

Simposio; Electron Back diffraction Meeting 2007; 2007

Royal Microscopy Society

This paper presents a coupling methodology between microstructure characterization, mechanical test and numerical simulations for polycrystalline materials that has been developed in order to compare directly and simultaneously numerical results to experimental ones at different length scales. This methodology is based on orientation imaging microscopy that is used to obtain a crystallographic orientations field of the zone of interest of the polycrystalline sample. Then these data can be analyzed to yield statistical information about the microstructure as the size of the representative volume element, based on texture analysis, and alto about the location of grain boundaries that is used to generate automatically a fine element mesh from a subsection of this investigated microstructure.