Energy-Dispersive RIXS

H. J. SÁNCHEZ; LEANI, JUAN J.

Frascati

Conferencia; HPXM2021; 2021

INFN-LNF

In X-ray fluorescence analysis, spectra present singular characteristics produced by thedifferent scattering processes. When atoms are irradiated with incident energy lower but closeto an absorption edge, scattering peaks appear due to an inelastic process known as ResonantInelastic X-ray Scattering (RIXS) or X-ray Resonant Raman Scattering (RRS) [1,2]. TheseRIXS/RRS peak presents a series of particular features; between them, a characteristic long-tailspreading to the region of lower energy. It has been recently observed that, hidden on this tail,there is valuable information about the local environment of the atom under study.In the last years, several works have reported a particular kind of RIXS measurements for thediscrimination, determination and characterization of chemical environments in a variety ofsamples and irradiation geometries, even in combination with other spectroscopic techniques[3-8]. One of the most important features of the experimental setup reported in these works isthe use of an energy dispersive low-resolution spectrometer to obtain high resolution results.In this work the new methodology to obtain high resolution result from low resolutionmeasurements, so-called EDIXS, is presented. Applications of EDIXS are described, Differentnon-conventional configurations, such as grazing incident/emission setups, micro-analysis, etc.are showed. Finally, the first test measurements using a conventional x-ray tube forcharacterizing oxidation states using EDIXS are presented.