INVESTIGADORES
ACHA Carlos Enrique
congresos y reuniones científicas
Título:
Resistive switching topology in metal-complex oxide interfaces
Autor/es:
A. SCHULMAN; C. ACHA
Lugar:
Buenos Aires
Reunión:
Congreso; At the Frontiers of Condensed Matter V; 2010
Institución organizadora:
CAC-CNEA
Resumen:
In order to determine the key parameters that control the resistive switching mechanism in metal-complex oxides
interfaces, we have studied the electrical properties of metal / YBa2Cu3O7 - (YBCO) interfaces using metals with
different oxidation energy and work function (Au, Ag, Pt) deposited by sputtering on the surface of a YBCO
ceramic sample. By analyzing the IV characteristics of the contact interfaces and the temperature dependence of
their resistance, we inferred that ion migration may generate or cancel conducting ¯laments, which modify the
resistance near the interface, in accordance with the predictions of a recent model.2Cu3O7 - (YBCO) interfaces using metals with
different oxidation energy and work function (Au, Ag, Pt) deposited by sputtering on the surface of a YBCO
ceramic sample. By analyzing the IV characteristics of the contact interfaces and the temperature dependence of
their resistance, we inferred that ion migration may generate or cancel conducting ¯laments, which modify the
resistance near the interface, in accordance with the predictions of a recent model.
