Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Approaches

A. FEDERICO; G. H. KAUFMANN

Advances in Speckle Metrology and Related Techniques

Wiley VCH Verlag

Lugar: Weinheim, Germany; Año: 2011; p. 147 - 200

This chapter reviews various algorithms for processing TSPI signals, which were developed mostly during the last decade. The selected topics are analyzed and discussed within the conceptual frame of the time-frequency representations of the temporal evolution of the intensity signal acquired at each pixel of the charge-coupled device (CCD) camera. This framework allows to develop a systematic approach in the phase recovery procedure, which is also advantageous when other related optical metrology techniques such as Digital Speckle Pattern Interferometry, Fringe Projection and Moir´e are used. These issues are naturally addressed if the temporal variable is thought as a dummy variable which can represent a privileged spatial direction. Therefore, the reader should note that the processing algorithms analyzed in this chapter can also be applied to the previously mentioned techniques.