Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices

SCHULMAN, ALEJANDRO; LANOSA, LEANDRO; ACHA, CARLOS

JOURNAL OF APPLIED PHYSICS

AMER INST PHYSICS

Lugar: New York; Año: 2015 vol. 118

0021-8979

Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7−ä (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels Et in the 0.06?0.11 eV range. Et remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime.