Growth and magnetic characterization of epitaxial Fe81Ga19/MgO (100) thin films

A. BUTERA; J. GÓMEZ; J. L. WESTON

JOURNAL OF APPLIED PHYSICS

Año: 2005 vol. 98 p. 33901 - 33906

0021-8979

Using magnetization and ferromagnetic resonance techniques, we have characterized Fe81Ga19 (100)thin films (90 nm thick) grown on MgO (100). We have observed that for low sputtering powers (<3 5 W) it is possible to grow films with cubic magnetic symmetry, and that larger powers inducean in-plane magnetic easy axis. Films with cubic symmetry were further characterized usingferromagnetic resonance at frequencies of 34 and 9.7 GHz. From the angular variation of theresonance field we have obtained the cubic magnetocrystalline anisotropy constant, K1=2E5 erg/cm3, and the saturation magnetization, M = 1460 emu/cm3. The magnitude and the angularvariation of the linewidth suggest an important contribution of the two-magnon scatteringmechanism to the relaxation of the magnetic excitations.