Critical coupling to Tamm plasmons

BAPTISTE AUGUIE; AXEL BRUCHHAUSEN; ALEJANDRO FAINSTEIN

Journal of Optics (IOP Publishing)

IOP

Año: 2015 vol. 17 p. 35003 - 35003

2040-8978

The conditions of critical coupling of light to Tamm plasmons are investigated with comprehensive numerical simulations, highlighting the parameters that maximize absorption of incident light in the metal layer. The asymmetric response in reflection and absorption with respect to the direction of incidence is discussed, the two cases yielding different optimal coupling conditions. These findings are relevant for the design of optimized Tamm structures, particularly in applications such as narrow-band thermal emitters, field-enhanced spectroscopy and refractive-index sensing.