Characterization of geometrically frustrated Zn1-xMnxAl2O4 thin films prepared by Metalorganic Aerosol Deposition

R D SANCHEZ; M E SALETA; O SHAPOVAL; K GEHRKE; V MOSHNYAGA; K SAMWER

Journal of Physics: Conference Series

IOP Publishing

Año: 2010 vol. 200 p. 720831 - 720834

1742-6588

We present the results on the structure and magnetoelectric properties ofZn1-xMnxAl2O4 thin films (0 <x < 1), prepared by metalorganic aerosol deposition (MAD)technique. The films have been grown epitaxially on MgO(100) substrates and characterized byX-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and Energy Dispersive X-rayanalysis (EDX), magnetization, electron paramagnetic resonance (EPR) and capacitance as afunction of temperature and magnetic field. For large x values (x = 0.75 and 1), we observeda deviation of the magnetization from a Curie-Weiss law below 40K, indicating the expectedmagnetic ordering of the spinel. In the proximity of this magnetic characteristic temperaturethe capacitance as a function of temperature shows a peak, which infers a multiferroic characterof these spinels.