Total Reflection X-Ray Fluorescence Analysis Using Plate Beam-guides

H. J. SÁNCHEZ

NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH B - BEAM INTERACTIONS WITH MATERIALS AND ATOMS

ELSEVIER SCIENCE BV

Lugar: Amsterdam; Año: 2002 vol. B194 p. 90 - 95

0168-583X

This work presents a new device for total reflection X-ray fluorescence analysis based on plate beam-guides. This device allows the photons transport inside a beam-guide maintaining the total reflection regime. Due to the basic characteristics of the experimental setup the system is easily aligned and can be mounted in conventional spectrometers without difficulty; this represents an important advantage with respect to standard equipment for total reflection analysis. Experimental spectra were measured using a conventional X-ray source and a reference sample. Detection limits were obtained and these values were compared with those obtained by means of conventional X-ray fluorescence analysis for the same sample and the same irradiation system.