INVESTIGADORES
SANCHEZ Hector Jorge
artículos
Título:
Determination of Γ using the Tilt of the Propagation Plane
Autor/es:
H. J. SÁNCHEZ; M. RUBIO
Revista:
X-RAY SPECTROMETRY
Editorial:
JOHN WILEY & SONS LTD
Referencias:
Lugar: LOndres; Año: 1993 vol. 222 p. 89 - 93
ISSN:
0049-8246
Resumen:
The product of fluorescence yield (0) and emission probability (r), was measured using a method based on the propagation plane inclination. Measurements of the Ka line of elements such as Cr, Fe and Ni on binary samples were carried out to determine the product wr. The results were compared with those reported in well known compilations. The proposed procedure can be considered a new alternative to increase the available set of methods for measuring fundamental parameters.
