INVESTIGADORES
SANCHEZ Hector Jorge
artículos
Título:
Monte Carlo Simulation of the Scattering Effects on the XRF Line
Autor/es:
H. J. SÁNCHEZ; R. SARTORI
Revista:
X-RAY SPECTROMETRY
Editorial:
JOHN WILEY & SONS LTD
Referencias:
Lugar: LOndres; Año: 1994 vol. 23 p. 141 - 148
ISSN:
0049-8246
Resumen:
A Monte Carlo program to simulate the scattering contributions to the x-ray fluorescent line was developed. Simulations were carried out on three pure samples (Z = 14, 28 and 40) in several geometrical situations (incident and take-off directions of the photons). The results show that the scattering effects do not exceed 4% for the analysed elements in the X-ray regime. Good agreement between normal incidence simulations and theoretical results was found. The vanishing of second-order interactions inside the sample when the propagation plane approx- imates 42 was also verified.
