INVESTIGADORES
SANCHEZ Hector Jorge
artículos
Título:
Total Reflection XRF Analysis of Impurities in Ice
Autor/es:
L. ARENA; H. J. SÁNCHEZ; O. NASELLO
Revista:
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH B - BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Editorial:
ELSEVIER SCIENCE BV
Referencias:
Lugar: Amsterdam; Año: 1995 vol. B100 p. 196 - 200
ISSN:
0168-583X
Resumen:
In this work, the Total-Reflection X-Ray Fluorescence Analysis technique, induced by Synchrotron Radiation (SRTRA), was used to determine traces of elements in ice bicrystals. Samples were obtained from a lo-? M water solution of HOK. The concentrations of K (Z = 19) in small volumes (< 5 ~1) of the ice bicrystals were measured. With these values of concentration the effective distribution coefficient &B was estimated.
