Theoretical Calculations of Detection Limits in Total-Reflection X-Ray Fluorescence Analysis

H. J. SÁNCHEZ

X-RAY SPECTROMETRY

JOHN WILEY & SONS LTD

Lugar: LOndres; Año: 1999 vol. 28 p. 51 - 59

0049-8246

Theoretical expressions for Ñuorescent intensity and scattered radiation in total reÑection experiments are presented. Trace elements in samples with di†erent matrices were studied. The contributions of the di†erent components were analyzed and a comparison with conventional x-ray Ñuorescence was performed. Detection limits were calculated as a function of the sample thickness in both experimental situations. Very interesting conclusions were obtained regarding the contribution of the reÑected beam, the components of the background and the behavior of detection levels. Copyright ( 1999 John Wiley & Sons, Ltd.