INVESTIGADORES
SANCHEZ Hector Jorge
artículos
Título:
Resonant Raman Scattering Background in XRF Spectra of Binary Samples
Autor/es:
H. J. SÁNCHEZ; J. J. LEANI
Revista:
RADIATION PHYSICS AND CHEMISTRY (OXFORD)
Editorial:
PERGAMON-ELSEVIER SCIENCE LTD
Referencias:
Lugar: Amsterdam; Año: 2015 vol. 107 p. 160 - 163
ISSN:
0969-806X
Resumen:
In x-ray fluorescence analysis,spectrapresentsingularcharacteristicsproducedbythedifferentscat- tering processes.Whenatomsareirradiatedwithincidentenergylowerandclosetoanabsorptionedge, scattering peaksappearduetoaninelasticprocessknownasresonantRamanscattering.Inthisworkwe present theoreticalcalculationsoftheresonantRamanscatteringcontributionstothebackgroundof x-ray fluorescence spectraofbinarysamplesofcurrenttechnologicalorbiologicalinterest.Ononehand, a binaryalloyofFewithtracesofMn(Mn:0.01%,Fe:99.99%)wasstudiedbecauseofitsimportancein the stainlesssteelsindustries.OnthesecondhandapuresampleofTiwithVtraces(Ti:99%,V:1%)was analyzed duetothecurrentrelevanceinmedicalapplications.Inordertoperformthecalculationsthe ShiraiwaandFujino´smodelwasusedtocalculatecharacteristicintensitiesandscatteringinteractions. This modelmakescertainassumptionsandapproximationstoachievethecalculations,especiallyinthe case ofthegeometricalconditionsandtheincidentandtake-offbeams.Forthebinarysamplestudiedin this workandtheconsideredexperimentalconditions,thecalculationsshowthattheresonantRaman scattering backgroundissignificant underthe fluorescent peak,affectsthesymmetryofthepeaksand, depending ontheconcentrations,overcomestheenhancementscontributions(secondary fluorescence
