CIOP 05384
CENTRO DE INVESTIGACIONES OPTICAS
Unidad Ejecutora - UE
artículos
Título:
Determination of refractive index and thickness of a multilayer structure with a single THz time domain spectroscopy measurement
Autor/es:
FEDERICO E. SANJUAN; ALEXANDER BOCKELT; BORJA VIDAL
Revista:
APPLIED OPTICS
Editorial:
OPTICAL SOC AMER
Referencias:
Lugar: Washington; Año: 2014 vol. 53 p. 4910 - 4913
ISSN:
0003-6935
Resumen:
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard THz time domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows non-invasive inspection of double layer compound products
