CHARACTERIZATION OF CERAMIC THIN FILMS AND BULKS BY AFM TECHNIQUES

MARIA LUZ SANTIAGO; SEBASTIÁN BAROLÍN; NADIA MAMANA; MARÍA ALEJANDRA FERNÁNDEZ SOLARTE; RODRIGO MACHADO; AGUSTÍN FRATTINI; ARIEL DI LORETO; OSCAR DE SANCTIS; NORA PELLEGRI

ACTA MICROSCOPICA

CIASEM

Año: 2009 vol. 18 p. 287 - 288

0798-4545

Many different samples were obtained by sol-gel and chemical solution deposition. These techniques are versatile methods that permit to fabricate films inside of a wide range of compositions, with a precise stoichiometry control and at low cost, starting from alcoxides or salts as the oxides precursor sources. In this work we present several ceramic and glass compositions where the atomic force microscopy techniques were used to characterize the obtained materials, and other studies are shown to compare, complete and confirm such results as DRX, DTA-Tg, UV-Vis, etc. These Techniques were used to determine properties like as grain size distribution, porosity, sintering mechanism, phase separation process, film thicknes, crystallization behaviour, etc. In this work we present several ceramic and glass compositions where the atomic force microscopy techniques were used to characterize the obtained materials, and other studies are shown to compare, complete and confirm such results as DRX, DTA-Tg, UV-Vis, etc. These techniques were used to determine properties like as grain size distribution, porosity, sintering mechanism, phase separation process, film thickness, crystallization behaviour, etc.