Field-enhanced scanning optical microscope

A. V. BRAGAS; O.E. MARTINEZ

OPTICS LETTERS

OPTICAL SOC AMER

Año: 2000

0146-9592

We present experimental results of an imaging technique that uses as a local probe the optical f ield enhancedat the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highlyoriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip?sampledistance, yielding the ultrahigh vertical resolution reached in the images