Flexible NbTiN thin films for superconducting electronics

S. J. REZINOVSKY NIETO; J. A. HOFER; M. SIRENA; N. HABERKORN

PHYSICA C - SUPERCONDUTIVITY

ELSEVIER SCIENCE BV

Lugar: Amsterdam; Año: 2023 vol. 607 p. 1354241 - 1354246

0921-4534

We compare the superconducting properties of 100 nm thick NbTiN films grown by reactive sputtering on silicon and flexible commercial polyimide. The samples are fabricated by co-sputtering using Nb and Ti targets at room temperature with a reactive atmosphere of N2 and Ar. The films display a polycrystalline structure and superconducting critical temperatures of 13.2 K on polyimide and 13.4 K on silicon. The analysis of the upper critical field reveals huge values, with extrapolation to zero close to 29 T for films on silicon and 23 T for those on polyimide. A comparison of the superconducting transition applying mechanical deformation is shown. Presenting a higher superconducting gap and upper critical fields above than the commonly used elemental Nb, the development of NbTiN thin films on flexible polyimide appears as a potential material for application in superconducting electronics.