STRUCTURAL AND MAGNETIC CHARACTERIZATION OF LA1-XSRXMNO3-BASED THIN FILMS AND MULTILAYERS, GROWN BY PULSED LASER DEPOSITION.

S CARREIRA; J. BRIATICO; J. SINNECKER; M SIRENA; L. STEREN

Buenos Aires

Conferencia; 27th International Conference on Low Temperature Physics; 2014

In this contribution we present a characterization of the magnetic and structural properties of low-doped manganite films and multilayers. These oxides have a potential application as components of magnetic tunnel junctions and spin filter devices. The scope of our research is to determine the influence of substrate-induced strains onto the magnetic properties of the layers. Bulk La1-xSrxMnO3 (LSMO) are insulators and antiferromagnetic up to x=0.1 and in many cases exhibit weak ferromagnetism.  However, we expect a different behaviour in the properties of thin films due to the fact that growth conditions critically affect the physical properties of oxide films.  We have deposited LSMO films and trilayers with x = 0.04, 0.1 and 0.33 and thickness varying from 4nm to 60nm. The samples were grown over (100) STO by laser ablation. Magnetization measurements and X-ray diffraction experiments were used to characterize the different structures.  The temperature dependence of the magnetization reveals the existence of a ferromagnetic order in LSMO0.04 and LSMO0.1 thin films and the effect of the substrate can be clearly appreciated  in magnetization loops. The magnetic coupling across the spacer  in  trilayers was probed by measuring detailed hysteresis loops as a function of temperature.