Modeling of the refractive index profile of a femtosecond written waveguide in LiNbO3

PRESTI, DAMIÁN A.; GUAREPI, VALENTÍN; VIDELA, FABIÁN; TORCHIA, GUSTAVO A.

SPIE

Society of Photo-Optical Instrumentation Engineers

Año: 2019 vol. 1112 p. 80 - 87

0277-786X

Femtosecond laser pulse systems allows to modify in a precise and permanent way the optical properties of a transparent materials. This process enables the direct writing of guiding structures in materials, commonly known as waveguides, which are the base for optical circuit fabrication. It is our interest to study the main characteristics of the waveguides manufactured by the laser micromachining technique. Here, an analysis of the resulting refractive index profile has been carried out. This characteristic is essential for the design and simulation of integrated optical circuits. In particular we have developed our research on the study of light coupling in a pair of type II waveguides made in Lithium Niobate (LiNbO3). These experimental backgrounds provide us with elements to adjust and test the retrieved profile. Taking into account different distance between tracks and writing energies, it is well known that the coupling length changes and the coupling ratio too. Then this study allows us to reconstruct the refractive index profile according to its manufacturing conditions. Modeling of the refractive index distribution profile is a key parameter to perform beam propagation mode simulations (BPM) to achieve more realistic results. So, by means of this method it is possible to obtain a general procedure to describe the characteristics of these kinds of waveguides. As a model test, integrated waveguides were built to corroborate their light coupling. In a first stage it is designed through BPM simulations then it is manufactured in an X-cut LiNbO3 crystal in order to check its operation according to the simulations carried out.