Temperature Stable Dielectric Properties in BaTiO3?Bi (Mg2/3Nb1/3)O3?NaNbO3 Solid Solution

RAZ MUHAMMAD; ASIF ALI; CAMARGO, JAVIER E.; CASTRO, MIRIAM S.

Chemistry Select

WILEY-VCH Verlag GmbH & Co.

Lugar: Weinheim; Año: 2020 vol. 5 p. 3730 - 3734

0.5BaTiO3?(0.5?x)Bi(Mg2/3Nb1/3)O3?xNaNbO3(x=0.1, 0.2 and 0.3)samples were processed via solid-state sintering route. Phaseidentification of the samples showed the formation of a singlephase cubic perovskite-structure (space group Pm-3 m) whichwas further confirmed using Raman spectroscopy. Microstructural analysis of the samples revealed some voids in thesamples while grain size was observed to decrease withincreasing NaNbO3 concentration. The addition of NaNbO3shifted Tm to below room temperature and the stability rangeof 0.5BaTiO3?0.5Bi(Mg2/3Nb1/3)O3 ceramics was enhanced. Thesample with x=0.20 exhibited εr(mid) = 400 �15% stable over awide temperature range from @85 to 500 °C and mostimportantly a low dielectric loss of < 0.05 stable across a widetemperature range @100 to 426 °C was maintained. Thethermally stable dielectric properties of sample x=0.2 suggeststhat it could be useful candidate material for capacitorapplications in both low (X9R) as well as harsh environmentapplications.