INVESTIGADORES
BRUSILOVSKY David Leopoldo
artículos
Título:
Capitalizing on the glass-etching effect of silver plating chemistry to contact si solar cells with homogeneous 100110 Ù/sq emitters
Autor/es:
EBONG, A. , COOPER, I.B. , ROUNSAVILLE, B.C. , ROHATGI, A., DOVRAT, M. , KRITCHMAN, E. , BRUSILOVSKY, D. , BENICHOU, A.
Revista:
IEEE ELECTRON DEVICE LETTERS
Editorial:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Referencias:
Año: 2011 vol. 32 p. 779 - 781
ISSN:
0741-3106
Resumen:
Homogeneous high-sheet-resistance emitter (HHSE),
excellent surface passivation, and high-quality contacts, along with
narrow gridlines, are needed for high-efficiency solar cells. However,
HHSE in conjunction with screen-printed (SP) contacts often
gives low fill factor (FF) because of high contact resistance. We
capitalized on the glass-etching property of light-induced plating
of silver to decrease the contact resistance and formed high-quality
contacts to 100110 Ù/sq HHSE. This led to the achievement of
78.5% FF, 38.3 mA/cm2 short-circuit current density (JSC) due
to narrow line widths (65 ìm), and efficiency of 18.7%.
to narrow line widths (65 ìm), and efficiency of 18.7%.
78.5% FF, 38.3 mA/cm2 short-circuit current density (JSC) due
to narrow line widths (65 ìm), and efficiency of 18.7%.
to narrow line widths (65 ìm), and efficiency of 18.7%.
Ù/sq HHSE. This led to the achievement of
78.5% FF, 38.3 mA/cm2 short-circuit current density (JSC) due
to narrow line widths (65 ìm), and efficiency of 18.7%.
to narrow line widths (65 ìm), and efficiency of 18.7%.
2 short-circuit current density (JSC) due
to narrow line widths (65 ìm), and efficiency of 18.7%.ìm), and efficiency of 18.7%.