INVESTIGADORES
MOREL Eneas Nicolas
artículos
Título:
Simultaneous measurement of deformation and thickness variation in polymer films
Autor/es:
ENEAS N. MOREL; JORGE R. TORGA
Revista:
SPIE Interferometry XIII: Applications
Editorial:
SPIE
Referencias:
Año: 2006 vol. 6293 p. 654 - 662
ISSN:
0277-786X
Resumen:
We present experimental results in deformation measurement and thickness change in polymer films employing Fourier domain interferometry. The set-up is a Michelson configuration in wich interference signal betweeen light reflected from a reference arm is superposed with two reflection from the first and second interface from the film sample. Distance measurements for determination of deformation and thickness values were obtained after an inverse Fourier transform of the spectrum signal. With this configuration, measurements with 1 micron axial resolution, and 2mm dynamic range were obtained.
