INVESTIGADORES
VON BILDERLING Catalina
congresos y reuniones científicas
Título:
High Resolution Combined AFM-Optical Microscope
Autor/es:
M. E. MASIP; C. VON BILDERLING; M. CALDAROLA; L. I. PIETRASANTA; A. V. BRAGAS
Lugar:
Buenos Aires
Reunión:
Otro; XII Giambiagi School, Nanophotonics; 2011
Institución organizadora:
Departamento de Física, FCEN, UBA
Resumen:
In our lab a multipurpose microscope has been designed, developed and cunstructed. It combines both an atomic force microscope (AFM) terminal and an inverted optical spectral microscope. This combination allows the simultaneous study of nanometric properties and the specific labeling provided by optical spectroscopy techniques.
