Characterization of Vanadium Oxidation States using EDIXS and EXAFS in Combination with FFT Analysis

SÁNCHEZ, HÉCTOR JORGE; JUAN JOSÉ LEANI

Congreso; International Hybrid Conference on X-ray Analysis (ICXRA-VI).; 2023

In this work, the analysis of the atomic environment of different compounds of vanadium is attained by using ED-RIXS and EXAFS techniques. While the application of FFT (Fast Fourier Transform) procedures is habitual in EXAFS, this methodology is applied for the first time in the RIXS spectra using energy-dispersive systems. Both results are presented and compared regarding the determination of atomic environment.