First IXSS-Results at LNLS

G. STUTZ; G. TIRAO; C. CUSATIS

LNLS

Congreso; X Reunión Anual de Usuarios del LNLS; 2000

LNLS

In the last years, with the construction of high resolution synchrotron radiation-based x-ray spectrometers, IXSS (inelastic x-ray scattering spectroscopy) has proved to be a powerful tool for investigating electronic properties of many-electron systems1. An IXSS experiment provides direct access to the dynamic of electron correlation by measuring the double-differential cross-section as a function of the transferred energy and momentum, provided that a spectrometer energy resolution of about 1 eV (at several keV incident energy) can be achieved. Such a high resolution requirement can be fulfilled by monochromatizing the white synchrotron radiation beam by using a narrow passband monochromator and by analysing the inelastically scattered spectrum by means of an analyser crystal in nearly back-diffraction geometry. The project of constructing an IXSS-spectrometer at the XRD-beamline of the LNLS has begun with a feasibility study2. Last year, the first back-diffracting analyser crystal was constructed and mounted at the XRD-station for testing3. In the current year, a new analyser was designed4 , providing better performances. In this report we present the first measurements of inelastic x-ray scattering carried out at LNLS.