A back-diffracting crystal analyser for the XRD beamline

TIRAO, G.; G. STUTZ; C. CUSATIS

Campinas, Brasil

Congreso; IX Workshop Anual de Usuarios del LNLS; 1999

The x-ray diffraction in backscattering regime, i.e. diffraction at Bragg angles close to 90°, has been advantageously applied to x-ray spectroscopic techniques requiring high energy resolution. An analyser crystal in backdiffraction geometry provides both a very high energy resolution and a wide angular acceptance of the beam. Several spectrometers for inelastic x-ray scattering spectroscopy in the regime of high1-3 (~1 eV) and ultra-high4,5 (~1 meV) energy resolution are based on focusing, back-reflecting crystals for the energy analysis of the scattered photons. A focusing back-diffracting analyser crystal was designed and constructed at LORXI (Laboratório de Óptica de Raios X e Instrumentação), Universidade Federal do Paraná, and mounted at the XRD beamline of the LNLS (Laboratório Nacional de Luz Síncrotron), where the energy resolution of a set-up, which will be destined to inelastic x-ray scattering spectroscopy, was characterized.