Study of (1s,3p) resonant inelastic x-ray scattering processes in Cr, Mn and Cu

G. STUTZ; G. TIRAO

LNLS, Campinas Brasil

Congreso; XIX Reunión Anual de Usuarios del LNLS; 2009

LNLS

Synchrotron radiation sources along with newly developedanalyzers based on back–diffracting crystals have made thestudy of second order x–ray interaction processes, such asthe resonant inelastic scattering, with both high resolution andhigh photon flux feasible. Inelastic x–ray scattering in the resonantregime (also called resonant x–ray Raman scattering)can be visualized as an x-ray absorption process followed byx–ray emission, with a virtual intermediate state and a finalstate composed of a core–hole in an upper atomic level andan excited electron above the Fermi level. The resonance conditionis achieved tuning the energy of the incident photonsclose to an absorption edge. Resonant inelastic x–ray scatteringspectroscopy (RIXS) can thus yield information similarto that obtained from x–ray absorption and emission spectroscopies,provided that high energy resolution is achieved. Inrecent years, RIXS has become a powerful technique to investigateelectronic excitations and electronic structure in condensedmatter [1]. In this report, results from first RIXS studieswith high energy resolution made at LNLS are presented.RIXS processes involving 1s and 3p atomic levels of Cr, Mnand Cu were studied.