The chemical information from high-resolution K X-Ray emission spectroscopy

S. LIMANDRI; G. TIRAO

cordoba

Simposio; 14th International Symposium on Radiation Physics; 2018

High-resolution XES experiments have been widely used for studying the chemical environment and the electronic structure of a wide variety of materials. This information can be obtained by measuring changes in some spectral features, such as energy shifts, possible satellite lines, line shapes and relative intensities. For 3d transition elements, the high-resolution Kβ spectrum shows a clear sensitivity to the chemical environment. Observable changes in the XES spectra can be quantified by many parameters [3-5]. A spectrum deconvolution can be performed if theoretical calculations are available and if the characteristics of the instrument used in the measurement are known. The spectrum fitting methodology is called the Fundamental Parameters Method. Spectral changes can also be quantified by a Statistical Procedure, treating the spectrum as a probability distribution and determining statistical parameters, such as the moments of the distribution. Another approach, Principal Component Analysis, is the application of multivariate analysis to relate the variability in-between spectra from samples with the chemical environment.