Construction of a focusing high-resolution crystal analyser for x-rays

TIRAO, G.; C. CUSATIS; G. STUTZ

X-RAY SPECTROMETRY

John Wiley & Sons, Ltd.

Lugar: INGLATERRA; Año: 2002 vol. 31 p. 158 - 161

0049-8246

We present the construction of a focusing x-ray analyser designed to operate in back-diffraction geometry. A spherical crystal surface was achieved by positioning about 2000 small Si crystals on a concave glass substrate. The analyser was mounted at the XRD beamline of the LNLS (Laborat¨®rio Nacional de Luz S¨ªncrotron) for testing the energy resolution of a spectrometer consisting of both a sagitally focusing monochromator and the analyser. Controlling the vertical angular divergence of the primary beam, resolving powers of DE/E ¡Ö 2 x 10-4 could be achieved with good intensity.