An inelastic x-ray scattering spectrometer at LNLS

TIRAO, G.; C. CUSATIS; G. STUTZ

JOURNAL OF SYNCHROTRON RADIATION

American Institute of Physics

Año: 2004 vol. 11 p. 335 - 342

0909-0495

A high-resolution spectrometer aimed at performing experiments ofinelastic X-ray scattering by electronic excitations is described. Thespectrometer has been installed at the D12A-XRD1 beamline of theNational Synchrotron Light Laboratory (LNLS), in Campinas, Brazil.Synchrotron radiation is monochromated to about 6 keVand focusedhorizontally onto the sample by a sagittally focusing Si(111) doublecrystalmonochromator in non-dispersive setting. The spectrometeroperates in Rowland circle geometry and is based on a focusingSi(333) analyser in near-backdiffraction geometry for energy analysisof inelastically scattered photons. The analyser works at a ®xed Braggangle, so energy transfers are obtained by varying the incident photonenergy. A relative energy resolution of the whole spectrometer of1.5 10ÿ4 at 5.93 keV has been achieved. As an example ofapplication, inelastic X-ray scattering by plasmon excitation inpolycrystalline Be was measured. Test results demonstrate thatinelastic X-ray scattering experiments with eV energy resolution andan acceptable counting rate are feasible at the LNLS when focusedon plasmon and particle±hole excitations.