A simples method to slope error characterization using X-ray optics

GAVINHO, L.; MAZZARO, I.; C. CUSATIS; TIRAO, G.

REVIEW OF SCIENTIFIC INSTRUMENTS

American Institute of Physics

Año: 2005 vol. 76 p. 53103 - 53108

0034-6748

This work shows a method to characterize nearly flat reflective surfaces. Slope error on the mirrorsurface under the total reflection condition of x rays is measured by perfect crystal rocking curveprofile widening. The experiment was performed using a conventional x-ray tube and a simpleoptical setup. The sensitivity was sufficient to detect at least a slope error of 7 mrad, typical qualityfor synchrotron mirrors. It is shown that this technique can also be used to characterize roughnessand curvature. The method proposed here is an alternative to the traditional techniques for surfacecharacterization and has the advantages of simplicity, versatility and sensitivity, and the synchrotronmirror quality can be evaluated under similar conditions as those for the designed operation.