INVESTIGADORES
TOLLEY Alfredo Juan
artículos
Título:
Formation of epitaxial -Sn islands at the interface of SiO2/Si layers implanted with Sn+ ions.
Autor/es:
LOPES J M J; ZAWISLAC, M C; FICHTNER, PAULO F P; PAPALEO, R M; LOVEY, FRANCISCO; CONDO, ADRIANA; TOLLEY, ALFREDO JUAN
Revista:
APPLIED PHYSICS LETTERS
Editorial:
American Institute of Physics
Referencias:
Año: 2005 vol. 86 p. 19191 - 19191
ISSN:
0003-6951
Resumen:
180 nm SiO2 layers on Si (100) were implanted with Sn ions
producing a profile with a peak
concentration of 3
at. % at the middle of the oxide. After high temperature (9001100 °C) annealing,
an array of beta-Sn
islands epitaxially attached to the Si was observed at the SiO2/Si (100) interface
due to the
migration of the implanted Sn atoms. The breakdown of the planar SiO2 /Si interface and
the appearance of
the island system is discussed in terms of the SnSi equilibrium properties. Our
results reveal a
new method to create a high density of nanosized islands with good uniformity
in
size and shape.