Nanocrystalline ZnO photoconductivity measurements

C. D. BOJORGE, M. F. BIANCHETTI , N. A. GÓMEZ, N. E. WALSÖE DE RECA AND H. R.CÁNEPA

Procedia Materials Science

Elsevier Ltd.

Año: 2012 vol. 1 p. 614 - 619

2211-8128

AbstractPure ZnO have been prepared on amorphous SiO2 substrates from a precursor solution of dihydrated zinc acetate andabsolute alcohol. The sol was deposited on the substrates by the spin-coating technique. After de deposit of each layer, adrying treatment was performed at 200 ºC for10 min, to solidify the deposited material. Finally, all the specimens werethermally treated at 450 ºC for 3 h to crystallize them. The characterization by X rays diffraction was performed using theglancing angle configuration and films morphology was observed with an Atomic Force Microscope and by FieldEmission Scanning Electron Microscopy. Photoconductivity was studied in function of the wavelength at 50 ºC using thefour-points method and illuminating by arrays of LEDs with different wavelengths.