High-resolution strain mapping in bulk samples using full profile analysis of energy dispersive synchrotron X-ray diffraction data

AXEL STEUWER; JAVIER ROBERTO SANTISTEBAN; MARK TURSKI; PHIL J WITHERS; THOMAS BUSLAPS

JOURNAL OF APPLIED CRYSTALLOGRAPHY

Año: 2004 vol. 37 p. 883 - 889

0021-8898

The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data.