X-ray micrographic imaging system based on COTS CMOS sensors

FABRICIO ALCALDE BESSIA; M. PEREZ; M. GÓMEZ BERISSO; N. PIUNNO; H. MATEOS; F. POMIRO; I. SIDELNIK; J. JERÓNIMO BLOSTEIN; M. SOFO HARO; JOSÉ LIPOVETZKY

Buenos Aires

Conferencia; Micro-Nanoelectronics, Technology and Applications (CAMTA), 2017 Argentine Conference of; 2017

This paper presents the use of Commercial Off TheShelf CMOS image sensors for the acquisition of X-ray imageswith high spatial resolution. The X-ray images, with applicationin biology, electronic components inspection or paleontologyresearch, are obtained with 8 keV photons from a Cu tube. Thequantum efficiency of the detector is estimated using attenuationlengths of photons in the sensor, and compared to traditionalscintillator conversion layers.