Graphical analysis of current-voltage characteristics in memristive interfaces

C. ACHA

JOURNAL OF APPLIED PHYSICS

AMER INST PHYSICS

Lugar: New York; Año: 2017 vol. 121 p. 1345021 - 1345026

0021-8979

A graphical representation of current-voltage (IV) measurements of typical memristive interfacesat constant temperature is presented. This is the starting point to extract relevant microscopic informationof the parameters that control the electrical properties of a device based on a particularmetal-oxide interface. The convenience of the method is illustrated presenting some exampleswhere the IV characteristics were simulated in order to gain insight into the influence of the fittingparameters.