Study of atomic displacement fields in shape memory alloys by high-resolution electron microscopy

M.J. HYTCH, PH. VERMAUT, J. MALARRIA, R. PORTIER

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

ELSEVIER SCIENCE SA

Lugar: Amsterdam; Año: 1999 vol. 273 p. 266 - 270

0921-5093

The distortion of the atomic lattice is determined using a recently developed method of analysing high resolution electron microscope images. The analysis is carried out in terms of the individual lattice fringes which contribute to the image contrast. A perfect set of fringes has an amplitude and phase given by the corresponding Fourier component. A distorted lattice can be analysed by introducing the concept of a ?local? Fourier component, representing the local values of amplitude and phase as a function in position of the image. The local phase is used to determine the line of a perfectly coherent interface between two sets of lattice planes. The degree of self-accommodation of a series of martensitic plates in a Cu?Zn?Al shape-memory-alloy is studied by the phase analysis of an experimental high resolution image.