MANGANESE OXIDE FILMS CHARACTERIZATION OF THE CHARGE ?DISCHARGE PROCESS

H.T. MISHIMA; B. LÓPEZ DE MISHIMA; H.M.VILLULLAS; M.LOPEZ TEIJELO

Veszprém - Balatonfured

Congreso; 47th Annual Meeting International Society Electrochemistry; 1996

International Society Electrochemistry

The deposition of manganese oxide films as well as charge-discharge cycles were studied by in situ ellipsometry. Manganese oxide films of different thickness were deposited on a platinum a platinum substrate from manganese solution ( ph= 2) by applying potentiostatic pulses. The charge-discharge process was studied in an alkaline borate solutions.The ellipsometric results for films of different thickness  electro reduced at -0.5 B show changes in the optical constant as compared with those of oxidized samples leading to a decreases of both , the refractive index and the extinction coefficient. During charge-discharge cycles, the optical response is highly reversible for thin films of oxide while a pronounced irreversibility is observed for thick films