INVESTIGADORES
LOPEZ Beatriz Alicia
artículos
Título:
The Ellipsometry of Anisotropic Manganese Dioxide Films Electrodeposited at Anodic Potentials
Autor/es:
J.O. ZERBINO; B. A. LÓPEZ DEMISHIMA; M. LÓPEZ TEIJELO; MA. MALÍZ; M. HERNÁNDEZ ÚBEDA
Revista:
JOURNAL OF THE BRAZILIAN CHEMICAL SOCIETY
Editorial:
SOC BRASILEIRA QUIMICA
Referencias:
Lugar: San Pablo; Año: 1997 vol. 8 p. 113 - 117
ISSN:
0103-5053
Resumen:
Thc galvanostatic electrodeposition of manganese dioxide films in the thickness range from 0to 1000 nm was investigated byin situ cllipsometry. The results obtained can be fit into the wholethickness range in terms of the uniaxial anisotropy of the film. The optical indices and thicknesseswere calculated. The anisotropic properties may be related to a preferential orientation of thedeposits.
