INVESTIGADORES
AVALOS Martina Cecilia
congresos y reuniones científicas
Título:
Study of the microstructure of a cold rolled interstitial free steel through X-Ray Diffraction and Electron Back-Scatter Diffraction
Autor/es:
E. BENATTI; N. DE VINCENTIS; M. AVALOS; H. BROKMEIER; N. SHELL; R. BOLMARO
Lugar:
St George Utah
Reunión:
Conferencia; 18th International Conference on Textures of Materials (ICOTOM-18); 2017
Institución organizadora:
ICOTOM
Resumen:
Hot and cold rolling are used for large-scale industrial processes,and can produce a rather complex intermixing of grain refinement, dislocationarrays and stacking faults, distorting the crystallographic lattice andinterfering with the motion of other defects. X-Ray Diffraction (XRD) allows aglobal characterization of the microstructure, through the analysis of theheight and shape of the diffraction peaks. Moreover, synchrotron XRD enablessuch analysis in relation with the sample orientation. Electron Back ScatterDiffraction (EBSD) studies, on the other hand, allows a more direct althoughlocal kind of study. In this work we use XRD to determine the texture of anInterstitial Free Steel, cold rolled to 70 % reduction, and relate the measuredtexture with the defect storage on different texture components through diffractionpeak broadening analysis. To that end we create Generalized Pole Figures (GPF)of Full Width Half Maximum (FWHM), and use the pole figure to ODF inversionmethod in the FWHM GPFs to find a generalized Orientation Distribution Function(ODF) which can be compared with the regular ODF used in texture analysis.Finally, we compare these results with EBSD measurements of the same sample toobtain a more direct estimation of the anisotropy of the defect storage of thesample. We found that the gamma fiber, usually present in rolled BCC materialsis the component which tend to store more defects, although X-Ray diffractionmethods fail to distinguish which kind of defects are the ones being stored.The typical alpha fiber was also found but it was rather cleaner from defects.Both results are in agreement with previous literature results for similarmaterials.