Low Resolution RIXS: A versatile Spectroscopic Tool for Chemical State Assessments - Invited Conference

J. ROBLEDO; H. J. SÁNCHEZ; J. J. LEANI

Buenos Aires

Simposio; International Forum on Advances in Radiation Physics; 2017

Universita di Bologna

In X-ray fluorescence analysis, spectra present singular characteristics produced by the different scattering processes. When atoms are irradiated with incident energy lower but close to an absorption edge, scattering peaks appear due to an inelastic process known as Resonant Inelastic X-ray Scattering (RIXS) or X-ray Resonant Raman Scattering (RRS) [1]. These RIXS/RRS peaks present a series of particular features; between them, a characteristic long-tail spreading to the region of lower energies. It has been recently observed that, hidden on this tail, there is valuable information about the local environment of the atom under study [2]. During the last five years, several works have been shown the first applications of RIXS (or RRS) for the discrimination, determination and characterization of chemical environments in a variety of samples and irradiation geometries and even combined with other spectroscopic techniques [3-8]. One of the most important features of the experimental setup reported in these works is the use of an energy dispersive low-resolution spectrometer for measuring the RIXS spectra. In this presentation, the basis, advantages, general highlights and latest applications of this novel and versatile tool for chemical state determinations will be presented and discussed.